{"id":22986,"date":"2025-05-08T07:54:04","date_gmt":"2025-05-08T07:54:04","guid":{"rendered":"https:\/\/v2smt.com\/?post_type=product&#038;p=22986"},"modified":"2025-05-08T07:54:04","modified_gmt":"2025-05-08T07:54:04","slug":"xrf-x-ray-fluorescence-8000","status":"publish","type":"product","link":"https:\/\/v2smt.com\/tr\/products\/xrf-x-ray-fluorescence-8000\/","title":{"rendered":"XRF X-\u0131\u015f\u0131n\u0131 Floresans\u0131 8000"},"content":{"rendered":"<p>XRF X-ray Floresan 8000 Uygulamalar\u0131<br \/>\nTemel olarak y\u00f6netmeliklerle kontrol edilen elektronik ve elektrikli \u00fcr\u00fcnlerde bulunan kur\u015fun (Pb), c\u0131va (Hg), kadmiyum (Cd), toplam krom (Cr) ve toplam brom (Br) gibi elementlerin tespiti i\u00e7in kullan\u0131l\u0131r. Halojenler taraf\u0131ndan kontrol edilen \u00fcr\u00fcnlerde klor (Cl) ve brom (Br) tespiti i\u00e7in kullan\u0131l\u0131r.<\/p>\n<p>K\u00fcresel Tehlikeli Madde Y\u00f6netmelikleri ve test y\u00f6ntemleri ile uyumlu<br \/>\nXRF X-ray Fluorescence 8000 analiz\u00f6r\u00fc, \u00fcr\u00fcn\u00fcn a\u015fa\u011f\u0131daki k\u00fcresel tehlikeli madde y\u00f6netmeliklerine ve test y\u00f6ntemlerine uygun olup olmad\u0131\u011f\u0131n\u0131 belirlemek i\u00e7in t\u00fcketici \u00fcr\u00fcnlerinin test edilmesinde bir tarama arac\u0131 olarak onaylanm\u0131\u015ft\u0131r:<br \/>\n- AB RoHS Direktifi (2011\/65\/EU)<br \/>\n- \u00c7in RoHS Direktifi (ACPEIP)<br \/>\n- Japonya RoHS<br \/>\n- Kore RoHS Direktifi<br \/>\n- ABD T\u00fcketici \u00dcr\u00fcn G\u00fcvenli\u011fi \u0130yile\u015ftirme Yasas\u0131 (CPSIA) (HR4040)<br \/>\n- ABD Halojensiz K\u0131s\u0131tlama Direktifi<br \/>\n- Kaliforniya \u00d6nerisi 65<br \/>\n- ABD CPSC-CH-E1002-08 SOP standart i\u015fletim prosed\u00fcr\u00fc<\/p>\n<p>XRF X-ray Floresan 8000 Giri\u015f <\/p>\n<p>XRF X-ray Fluorescence 8000, \u00e7ift radyasyon koruma sistemi, insanla\u015ft\u0131r\u0131lm\u0131\u015f \u00e7al\u0131\u015fma aray\u00fcz\u00fc, ampirik katsay\u0131 y\u00f6nteminin kapsaml\u0131 uygulamas\u0131 ve temel parametre y\u00f6ntemi V1.0 analiz yaz\u0131l\u0131m\u0131 ile \u00fcst d\u00fczey bir modeldir. Elementel test aral\u0131\u011f\u0131 S-U'dur. Yani, y\u00f6netmeliklerdeki kur\u015fun (Pb), c\u0131va (Hg), kadmiyum (Cd), toplam brom (Br) ve toplam kromu (Cr) tespit edebilir ve ayr\u0131ca halojensiz direktif elementindeki klor (Cl) ve bromu (Br) tespit edebilir. \u0130yi tasarlanm\u0131\u015f a\u00e7\u0131k \u00e7al\u0131\u015fma e\u011frisi i\u015flevi, \u00f6zellikle \u00e7e\u015fitli malzemelerin fabrika proses kontrol\u00fc i\u00e7in uygundur. End\u00fcstrideki geleneksel yayg\u0131n cihazlarla kar\u015f\u0131la\u015ft\u0131r\u0131ld\u0131\u011f\u0131nda, bu model mevcut end\u00fcstrideki malzeme anormalliklerinin h\u0131zl\u0131 analizi ve tan\u0131mlanmas\u0131 avantajlar\u0131na sahiptir. M\u00fc\u015fterinin HSF kontrol taleplerini tam olarak \u00e7\u00f6zen verimli ve do\u011fru bir sistem \u00e7\u00f6z\u00fcm\u00fcne dayanmaktad\u0131r. Bu \u00e7\u00f6z\u00fcm\u00fcn prensibi a\u00e7\u0131k, y\u00f6ntemi uygulanabilir ve etkisi dikkate de\u011ferdir.<\/p>\n<p>Anormal malzeme: orijinal tam spektrumlu kar\u015f\u0131la\u015ft\u0131rma i\u015flevi, tedarik\u00e7i malzeme anormalli\u011finin ger\u00e7ek zamanl\u0131 takibi ve zaman\u0131nda uyar\u0131, RoHs \/ halojensiz ve tedarik\u00e7i kontrol\u00fcnde benzersiz avantajlara sahiptir.<\/p>\n<p>XRF X-ray Floresan 8000 \u00e7al\u0131\u015fma ko\u015fullar\u0131\uff1a<\/p>\n<p>\u00c7al\u0131\u015fma s\u0131cakl\u0131\u011f\u0131 \uff1a 15-30 \u2103<br \/>\nBa\u011f\u0131l nem\uff1a40%\uff5e50%<br \/>\nG\u00fc\u00e7 kayna\u011f\u0131: AC: 220V \u00b15V<br \/>\nNet a\u011f\u0131rl\u0131k\uff1a42Kg<br \/>\nEkipman boyutu\uff1a525mm(G)\uff0a390mm(D)\uff0a360mm(Y)<br \/>\n\u00d6rnek odas\u0131 boyutu\uff1a439*300*50mm<\/p>\n<p>XRF X-ray Floresan 8000 Teknik performans ve g\u00f6stergeler:<br \/>\n\uf06cThe element analizi aral\u0131\u011f\u0131 Magnezyum (Mg) ile uranyum (U) aras\u0131nda de\u011fi\u015fmektedir.<br \/>\n\uf06cThe element i\u00e7eri\u011fi analizi aral\u0131\u011f\u0131 1 PPm ila 99,99% aras\u0131ndad\u0131r.<br \/>\n\uf06cMeasurement zaman: 100-300 saniye.<br \/>\n\uf06cThe RoHS direktifinde belirtilen zararl\u0131 elementlerin tespit limiti (Cd\/Pb\/Cr\/Hg\/Br ile s\u0131n\u0131rl\u0131d\u0131r) 1PPM'ye kadar ula\u015fabilir.<br \/>\n\uf06cAt ayn\u0131 zamanda d\u00fczinelerce veya daha fazla elementi ve be\u015f kat kaplamay\u0131 analiz edebilir<br \/>\n\uf06cThe analiz i\u00e7in tespit limiti 2ppm'ye ula\u015fabilir ve kaplama analizi 0.005um kal\u0131nl\u0131\u011f\u0131ndaki numuneleri analiz edebilir<br \/>\n\uf06cPower besleme: AC 220V \u00b1 5V. (AC ar\u0131tma stabilize g\u00fc\u00e7 kayna\u011f\u0131 yap\u0131land\u0131r\u0131lmas\u0131 \u00f6nerilir).<br \/>\n\uf06cThe kaplama kal\u0131nl\u0131\u011f\u0131 genellikle m i\u00e7inde 30 \u03bc'dur (her malzeme i\u00e7in farkl\u0131d\u0131r)<br \/>\n\uf06cMultiple se\u00e7ilebilir analiz ve tan\u0131mlama modelleri.<br \/>\n\uf06cIndependent matris etkisi d\u00fczeltme modeli.<br \/>\n\uf06cMultivariable do\u011frusal olmayan kurtarma program\u0131<br \/>\n\uf06cThe Kaplama kal\u0131nl\u0131\u011f\u0131n\u0131n \u00e7oklu \u00f6l\u00e7\u00fcmlerinin tekrarlanabilirli\u011fi 0.1%'ye ula\u015fabilir<br \/>\n\uf06cThe kaplama kal\u0131nl\u0131\u011f\u0131 \u00f6l\u00e7\u00fcm\u00fcn\u00fcn uzun vadeli kararl\u0131l\u0131\u011f\u0131 0.1%'ye ula\u015fabilir<br \/>\n\uf06cThe enerji \u00e7\u00f6z\u00fcn\u00fcrl\u00fc\u011f\u00fc 144 \u00b1 5 elektron volttur.<br \/>\n\uf06cThe s\u0131cakl\u0131k adaptasyon aral\u0131\u011f\u0131 15 \u2103 ila 30 \u2103'dir.<\/p>\n<p>XRF X-ray Floresan 8000 \u00dcr\u00fcn \u00f6zellikleri<br \/>\n\uf06cA ROHS ve EN71 gibi \u00e7evre direktifleri i\u00e7in \u00f6zel olarak tasarlanm\u0131\u015f \u00fcr\u00fcn.<br \/>\n\uf06cBreaking geleneksel d\u00fcz enstr\u00fcman tasar\u0131m\u0131ndan uzakla\u015farak aerodinamik entegre bir tasar\u0131m benimseyen enstr\u00fcman, \u015f\u0131k ve zariftir.<br \/>\n\uf06cUsing S\u0131v\u0131 nitrojen so\u011futma yerine elektrikle so\u011futulan Amerikan Amptek dedekt\u00f6r\u00fc SDD, k\u00fc\u00e7\u00fck bir hacme, do\u011fru veri analizine ve d\u00fc\u015f\u00fck bak\u0131m maliyetine sahiptir.<br \/>\n\uf06cAdopting kendi geli\u015ftirdi\u011fi SES sinyal i\u015fleme sistemi, \u00f6l\u00e7\u00fcm hassasiyetini etkili bir \u015fekilde geli\u015ftirir ve \u00f6l\u00e7\u00fcm\u00fc daha do\u011fru hale getirir.<br \/>\n\uf06cOne t\u0131klamal\u0131 otomatik test, kullan\u0131m\u0131 daha basit, daha kullan\u0131\u015fl\u0131 ve daha kullan\u0131c\u0131 dostu.<br \/>\n\uf06cSeven farkl\u0131 numunelere g\u00f6re otomatik olarak ge\u00e7i\u015f yapan optik yol d\u00fczeltme ve kolimasyon sistemleri t\u00fcrleri.<br \/>\n\uf06cMultiple radyasyon s\u0131z\u0131nt\u0131s\u0131n\u0131 \u00f6nleme tasar\u0131m\u0131, benzer \u00fcr\u00fcnler aras\u0131nda en y\u00fcksek radyasyon koruma seviyesine sahiptir.<br \/>\n\uf06cAdvanced entegre \u0131s\u0131 da\u011f\u0131tma tasar\u0131m\u0131, makinenin genel \u0131s\u0131 da\u011f\u0131tma performans\u0131n\u0131 b\u00fcy\u00fck \u00f6l\u00e7\u00fcde geli\u015ftirerek \u00e7ekirdek bile\u015fenlerin g\u00fcvenli bir \u015fekilde \u00e7al\u0131\u015fmas\u0131n\u0131 sa\u011flar.<br \/>\n\uf06cThe 1.7.9 benzersiz hareket s\u0131cakl\u0131\u011f\u0131 kontrol teknolojisi, X-\u0131\u015f\u0131n\u0131 kayna\u011f\u0131n\u0131n g\u00fcvenli ve g\u00fcvenilir \u00e7al\u0131\u015fmas\u0131n\u0131 sa\u011flar, hizmet \u00f6mr\u00fcn\u00fc etkili bir \u015fekilde uzat\u0131r ve kullan\u0131m maliyetlerini azalt\u0131r.<br \/>\n\uf06cMultiple Yaz\u0131l\u0131m arac\u0131l\u0131\u011f\u0131yla tamamen izlenebilen cihaz aksesuar koruma sistemi, cihaz\u0131n daha istikrarl\u0131 ve g\u00fcvenli \u00e7al\u0131\u015fmas\u0131n\u0131 sa\u011flar.<br \/>\n\uf06cROHS standart pencere tasar\u0131m\u0131, kullan\u0131c\u0131 dostu aray\u00fcz\u00fc ve kolay kullan\u0131m\u0131 ile \u00f6zel test yaz\u0131l\u0131m\u0131.<br \/>\n\uf06cThis makinesi, do\u011fru, y\u00fcksek h\u0131zl\u0131 ve etkili veri iletimini etkin bir \u015fekilde sa\u011flayan USB2.0 aray\u00fcz\u00fcn\u00fc benimser\u3002<\/p>\n<p>Avantajlar<br \/>\n1. Do\u011fruluk: Anahtar kontrol malzemelerini test etmek i\u00e7in belirli bir \u00e7al\u0131\u015fma alan\u0131na sahip a\u00e7\u0131k \u00e7al\u0131\u015fma e\u011frisi.<br \/>\n2. H\u0131z: Kendi geli\u015ftirdi\u011fi h\u0131zl\u0131 spektrum kar\u015f\u0131la\u015ft\u0131rma analiz y\u00f6ntemi, tedarik\u00e7i malzeme de\u011fi\u015fikliklerinin zaman\u0131nda uyar\u0131 i\u015flevi.<br \/>\n3. G\u00fcvenlik: \u00c7ift X-\u0131\u015f\u0131n\u0131 korumas\u0131 (yaz\u0131l\u0131m, donan\u0131m, labirent tasar\u0131m\u0131), operat\u00f6rlerin ki\u015fisel g\u00fcvenli\u011fini ve kazara \u00e7al\u0131\u015fman\u0131n neden oldu\u011fu radyasyon hasar\u0131n\u0131 sa\u011flamak i\u00e7in.<br \/>\n4. B\u00fcy\u00fck numune odas\u0131n\u0131n tasar\u0131m\u0131, geleneksel modelden daha geni\u015f bir alan sa\u011flar.<br \/>\n5. Klor (Cl) elementinin tespit limitini azaltan yeni bir optik yol tasar\u0131m\u0131n\u0131n benimsenmesi.<br \/>\n6. Kullan\u0131c\u0131lar i\u00e7in zararl\u0131 maddeleri kontrol etmek i\u00e7in alg\u0131lama \u015femas\u0131n\u0131 \u00f6zelle\u015ftirebilen a\u00e7\u0131k bir \u00e7al\u0131\u015fma e\u011frisi kalibrasyon platformu sa\u011flay\u0131n.<br \/>\n7. D\u00fcnyan\u0131n \u00f6nde gelen XRF analiz yaz\u0131l\u0131m\u0131, ampirik katsay\u0131 y\u00f6ntemi ve temel parametre y\u00f6ntemi (FP y\u00f6ntemi) dahil olmak \u00fczere analiz y\u00f6ntemlerini entegre eder.<br \/>\n8. Test verilerinin do\u011frulu\u011funu tam olarak garanti edin.<br \/>\n9. Test raporunun \u00e7\u0131kt\u0131 format\u0131 (Excel, PDF, vb.), fabrikan\u0131n \u00e7e\u015fitli istatistiksel ve format gereksinimlerini kar\u015f\u0131layan kullan\u0131c\u0131n\u0131n gereksinimlerine g\u00f6re \u00f6zelle\u015ftirilebilir.<br \/>\n10. \u00c7ok dilli yaz\u0131l\u0131m aray\u00fcz\u00fc mevcuttur.<\/p>","protected":false},"excerpt":{"rendered":"<p>XRF X-ray Fluorescence 8000 Applications It is mainly used for the detection of elements such as lead (Pb), mercury (Hg),&#8230;<\/p>","protected":false},"featured_media":22989,"comment_status":"closed","ping_status":"closed","template":"","meta":{"iawp_total_views":14},"etheme_brands":[{"term_id":181,"name":"XRF","slug":"xrf","term_group":0,"term_taxonomy_id":181,"taxonomy":"brand","description":"","parent":0,"count":3,"filter":"raw"}],"product_brand":[],"product_cat":[137],"product_tag":[],"class_list":{"0":"post-22986","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"brand-xrf","7":"product_cat-x-ray-inspection","9":"first","10":"instock","11":"shipping-taxable","12":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/v2smt.com\/tr\/wp-json\/wp\/v2\/product\/22986","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/v2smt.com\/tr\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/v2smt.com\/tr\/wp-json\/wp\/v2\/types\/product"}],"replies":[{"embeddable":true,"href":"https:\/\/v2smt.com\/tr\/wp-json\/wp\/v2\/comments?post=22986"}],"version-history":[{"count":0,"href":"https:\/\/v2smt.com\/tr\/wp-json\/wp\/v2\/product\/22986\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/v2smt.com\/tr\/wp-json\/wp\/v2\/media\/22989"}],"wp:attachment":[{"href":"https:\/\/v2smt.com\/tr\/wp-json\/wp\/v2\/media?parent=22986"}],"wp:term":[{"taxonomy":"brand","embeddable":true,"href":"https:\/\/v2smt.com\/tr\/wp-json\/wp\/v2\/etheme_brands?post=22986"},{"taxonomy":"product_brand","embeddable":true,"href":"https:\/\/v2smt.com\/tr\/wp-json\/wp\/v2\/product_brand?post=22986"},{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/v2smt.com\/tr\/wp-json\/wp\/v2\/product_cat?post=22986"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/v2smt.com\/tr\/wp-json\/wp\/v2\/product_tag?post=22986"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}